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  1. XTS - We bring new light to your RF measurement data

    XTS - Simplifying Laboratory Life and On Wafer Testing. We have unique knowledge of how to create, catalog and analyze RF measurement data. Our software and ...
    optimization3
    process3
    device2
    semiconductor2
    characterization1
    spectrum analysis1
    rf testing1
    noise measurements1
    power measurements1
    Wafer testing1
    de-embedding1
    noise parameters0
    on wafer testing0
    on-wafer testing0
    rf test software0
    S-Parameter measurements0

    www.xts.ca - 2009-02-12

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